From fab to global supply chain

We make oxygen data ubiquitous and scalable by putting it on a chip.

Monitoring from the inside

Measure

O₂, RH and temperature inside FOUPs and FOSBs

Identify

air ingress and moisture excursions

Retrieve

data wirelessly for incoming QA and process improvement

Deploy

compact, battery-powered monitoring where conventional instruments cannot fit

See the conditions Understand the events

Use measured RH to inform nitrogen purge duration. Identify air ingress through changes in O₂. Review environmental history when investigating quality issues.

Tablet showing live oxygen, humidity and temperature data in the lab

Designed for the journey

Contamination event detection

identify oxygen and moisture ingress

01

Storage & transport monitoring

track conditions across wafer logistics and storage

02

Process optimization

verify purge and contamination-control performance

03

Regulatory & QA documentation

support compliance records with logged data

04

Battery-powered

Wireless retrieval

1 min intervals

37 × 37 × 14 mm

Evaluate FaradaIC in your application

Tell us what you need to monitor. Let’s explore how FaradaIC could fit your process.

Meet us at

SEMICON

Hall B1

Stand B1521

Book a meeting